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SYSTEM TO IDENTIFY RARE DEFECTS IN A MICRO SCALE PRODUCT USING MACHINE LEARNING
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SYSTEM TO IDENTIFY RARE DEFECTS IN A MICRO SCALE PRODUCT USING MACHINE LEARNING
ORDINARY APPLICATION
Published
Filed on 27 June 2020
Patent Information
| Application ID | 202041027346 |
| Date of Application | 27/06/2020 |
Documents
| Name | Date |
|---|---|
| 202041027346-FER.pdf | 18/10/2021 |
| 202041027346-FORM 13 [15-07-2020(online)].pdf | 15/07/2020 |
| 202041027346-FORM-26 [15-07-2020(online)].pdf | 15/07/2020 |
| 202041027346-COMPLETE SPECIFICATION [27-06-2020(online)].pdf | 27/06/2020 |
| 202041027346-DRAWINGS [27-06-2020(online)].pdf | 27/06/2020 |
| 202041027346-FORM 1 [27-06-2020(online)].pdf | 27/06/2020 |
| 202041027346-FORM 18 [27-06-2020(online)].pdf | 27/06/2020 |
| 202041027346-FORM-9 [27-06-2020(online)].pdf | 27/06/2020 |
| 202041027346-REQUEST FOR EARLY PUBLICATION(FORM-9) [27-06-2020(online)].pdf | 27/06/2020 |
| 202041027346-REQUEST FOR EXAMINATION (FORM-18) [27-06-2020(online)].pdf | 27/06/2020 |
