Consult an Expert
Trademark
Design Registration
Consult an Expert
Trademark
Copyright
Patent
Infringement
Design Registration
More
Consult an Expert
Consult an Expert
Trademark
Design Registration
Login
Patent search/
SYSTEM FOR MEASURING MICROBENDS AND ARBITRARY MICRO-DEFORMATIONS ALONG A THREE-DIMENSIONAL SPACE
Patent Search in India
Extensive patent search conducted by a registered patent agent
Patent search done by experts in under 48hrs
₹999
₹399
Talk to expert
Abstract
Information
Inventors
Applicants
Specification
Documents
SYSTEM FOR MEASURING MICROBENDS AND ARBITRARY MICRO-DEFORMATIONS ALONG A THREE-DIMENSIONAL SPACE
PCT NATIONAL PHASE APPLICATION
Published
Filed on 12 October 2022
Patent Information
| Application ID | 202217058245 |
| Date of Application | 12/10/2022 |
Documents
| Name | Date |
|---|---|
| 202217058245-FORM 18 [27-07-2023(online)].pdf | 27/07/2023 |
| 202217058245-Proof of Right [15-03-2023(online)].pdf | 15/03/2023 |
| 202217058245-FORM-26 [09-12-2022(online)].pdf | 09/12/2022 |
| 202217058245-COMPLETE SPECIFICATION [12-10-2022(online)].pdf | 12/10/2022 |
| 202217058245-DECLARATION OF INVENTORSHIP (FORM 5) [12-10-2022(online)].pdf | 12/10/2022 |
| 202217058245-DRAWINGS [12-10-2022(online)].pdf | 12/10/2022 |
| 202217058245-FORM 1 [12-10-2022(online)].pdf | 12/10/2022 |
| 202217058245-STATEMENT OF UNDERTAKING (FORM 3) [12-10-2022(online)].pdf | 12/10/2022 |
| 202217058245-TRANSLATIOIN OF PRIOIRTY DOCUMENTS ETC. [12-10-2022(online)].pdf | 12/10/2022 |
