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SCALABLE Built-In Self-Test (BIST) FOR TESTING OF DIGITAL CIRCUITS USING REVERSIBLE LOGIC
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Abstract
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SCALABLE Built-In Self-Test (BIST) FOR TESTING OF DIGITAL CIRCUITS USING REVERSIBLE LOGIC
ORDINARY APPLICATION
Published
Filed on 6 July 2022
Patent Information
| Application ID | 202241038798 |
| Date of Application | 06/07/2022 |
Documents
| Name | Date |
|---|---|
| 202241038798-COMPLETE SPECIFICATION [06-07-2022(online)].pdf | 06/07/2022 |
| 202241038798-DECLARATION OF INVENTORSHIP (FORM 5) [06-07-2022(online)].pdf | 06/07/2022 |
| 202241038798-DRAWINGS [06-07-2022(online)].pdf | 06/07/2022 |
| 202241038798-FORM 1 [06-07-2022(online)].pdf | 06/07/2022 |
| 202241038798-REQUEST FOR EARLY PUBLICATION(FORM-9) [06-07-2022(online)].pdf | 06/07/2022 |
