Consult an Expert
Trademark
Design Registration
Consult an Expert
Trademark
Copyright
Patent
Infringement
Design Registration
More
Consult an Expert
Consult an Expert
Trademark
Design Registration
Login
Patent search/
RESISTANCE MEASUREMENT SYSTEM AND METHOD OF USING THE SAME
Patent Search in India
Extensive patent search conducted by a registered patent agent
Patent search done by experts in under 48hrs
₹999
₹399
Talk to expert
Abstract
Information
Inventors
Applicants
Specification
Documents
RESISTANCE MEASUREMENT SYSTEM AND METHOD OF USING THE SAME
PCT NATIONAL PHASE APPLICATION
Published
Filed on 21 August 2014
Patent Information
| Application ID | 7025/DELNP/2014 |
| Date of Application | 21/08/2014 |
Documents
| Name | Date |
|---|---|
| 7025-delnp-2014-Correspondance Others-(04-02-2015).pdf | 04/02/2015 |
| 7025-delnp-2014-Form-3-(04-02-2015).pdf | 04/02/2015 |
| 7025-delnp-2014-Claims.pdf | 10/11/2014 |
| 7025-delnp-2014-Correspondence Others.pdf | 10/11/2014 |
| 7025-delnp-2014-Drawings.pdf | 10/11/2014 |
| 7025-delnp-2014-Form-1.pdf | 10/11/2014 |
| 7025-delnp-2014-Form-2.pdf | 10/11/2014 |
| 7025-delnp-2014-Form-3.pdf | 10/11/2014 |
| 7025-delnp-2014-Form-5.pdf | 10/11/2014 |
| 7025-delnp-2014-GPA.pdf | 10/11/2014 |
| 7025-DELNP-2014.pdf | 02/10/2014 |
| 7025-delnp-2014-Assignment-(18-09-2014).pdf | 18/09/2014 |
