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PIN FOR A SEMICONDUCTOR CHIP TEST AND SOCKET FOR A SEMICONDUCTOR CHIP TEST INCLUDING SAME
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PIN FOR A SEMICONDUCTOR CHIP TEST AND SOCKET FOR A SEMICONDUCTOR CHIP TEST INCLUDING SAME
PCT NATIONAL PHASE APPLICATION
Published
Filed on 11 December 2013
Patent Information
| Application ID | 10654/DELNP/2013 |
| Date of Application | 11/12/2013 |
Documents
| Name | Date |
|---|---|
| 10654-DELNP-2013-Correspondence-Others-(25-06-2014).pdf | 25/06/2014 |
| 10654-DELNP-2013-GPA-(25-06-2014).pdf | 25/06/2014 |
| 10654-DELNP-2013.pdf | 02/06/2014 |
| 10654-delnp-2013-Correspondence-Others-(09-05-2014).pdf | 09/05/2014 |
| 10654-delnp-2013-Form-3-(09-05-2014).pdf | 09/05/2014 |
| 10654-delnp-2013-Abstract.pdf | 25/04/2014 |
| 10654-delnp-2013-Claims.pdf | 25/04/2014 |
| 10654-delnp-2013-Correspondence-others.pdf | 25/04/2014 |
| 10654-delnp-2013-Desription (Complete).pdf | 25/04/2014 |
| 10654-delnp-2013-Drawings.pdf | 25/04/2014 |
| 10654-delnp-2013-Form-1.pdf | 25/04/2014 |
| 10654-delnp-2013-Form-2.pdf | 25/04/2014 |
| 10654-delnp-2013-Form-3.pdf | 25/04/2014 |
| 10654-delnp-2013-Form-5.pdf | 25/04/2014 |
