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METHODOLOGY TO EXTRACT STRESS MAPS FROM ELECTRON BACKSCATTER DIFFRACTION DATA
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Abstract
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METHODOLOGY TO EXTRACT STRESS MAPS FROM ELECTRON BACKSCATTER DIFFRACTION DATA
ORDINARY APPLICATION
Published
Filed on 7 March 2020
Patent Information
| Application ID | 202011009920 |
| Date of Application | 07/03/2020 |
Documents
| Name | Date |
|---|---|
| 202011009920-IntimationOfGrant23-03-2023.pdf | 23/03/2023 |
| 202011009920-PatentCertificate23-03-2023.pdf | 23/03/2023 |
| 202011009920-CLAIMS [20-12-2021(online)].pdf | 20/12/2021 |
| 202011009920-COMPLETE SPECIFICATION [20-12-2021(online)].pdf | 20/12/2021 |
| 202011009920-FER_SER_REPLY [20-12-2021(online)].pdf | 20/12/2021 |
| 202011009920-OTHERS [20-12-2021(online)].pdf | 20/12/2021 |
| 202011009920-FER.pdf | 03/11/2021 |
| abstract.jpg | 18/10/2021 |
| 202011009920-Proof of Right [14-03-2020(online)].pdf | 14/03/2020 |
| 202011009920-COMPLETE SPECIFICATION [07-03-2020(online)].pdf | 07/03/2020 |
| 202011009920-DRAWINGS [07-03-2020(online)].pdf | 07/03/2020 |
| 202011009920-FIGURE OF ABSTRACT [07-03-2020(online)].jpg | 07/03/2020 |
| 202011009920-FORM 1 [07-03-2020(online)].pdf | 07/03/2020 |
| 202011009920-FORM 18 [07-03-2020(online)].pdf | 07/03/2020 |
| 202011009920-POWER OF AUTHORITY [07-03-2020(online)].pdf | 07/03/2020 |
| 202011009920-REQUEST FOR EXAMINATION (FORM-18) [07-03-2020(online)].pdf | 07/03/2020 |
| 202011009920-STATEMENT OF UNDERTAKING (FORM 3) [07-03-2020(online)].pdf | 07/03/2020 |
