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METHOD TO MEASURE TRANSIENT V-I CHARACTERISTICS OF MEMRISTOR ON OSCILLOSCOPE WITHOUT USING CURRENT PROBES

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METHOD TO MEASURE TRANSIENT V-I CHARACTERISTICS OF MEMRISTOR ON OSCILLOSCOPE WITHOUT USING CURRENT PROBES

ORDINARY APPLICATION

Published

date

Filed on 18 March 2023

Patent Information

Application ID202311018475
Date of Application18/03/2023

Documents

NameDate
202311018475-FORM 18 [28-06-2023(online)].pdf28/06/2023
202311018475-COMPLETE SPECIFICATION [18-03-2023(online)].pdf18/03/2023
202311018475-DECLARATION OF INVENTORSHIP (FORM 5) [18-03-2023(online)].pdf18/03/2023
202311018475-DRAWINGS [18-03-2023(online)].pdf18/03/2023
202311018475-EVIDENCE FOR REGISTRATION UNDER SSI [18-03-2023(online)].pdf18/03/2023
202311018475-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [18-03-2023(online)].pdf18/03/2023
202311018475-FIGURE OF ABSTRACT [18-03-2023(online)].pdf18/03/2023
202311018475-FORM 1 [18-03-2023(online)].pdf18/03/2023
202311018475-FORM FOR SMALL ENTITY [18-03-2023(online)].pdf18/03/2023
202311018475-FORM FOR SMALL ENTITY(FORM-28) [18-03-2023(online)].pdf18/03/2023
202311018475-FORM-9 [18-03-2023(online)].pdf18/03/2023
202311018475-POWER OF AUTHORITY [18-03-2023(online)].pdf18/03/2023
202311018475-REQUEST FOR EARLY PUBLICATION(FORM-9) [18-03-2023(online)].pdf18/03/2023
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