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METHOD AND SYSTEM FOR VISUAL INSPECTION OF SENSOR CHIPS

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METHOD AND SYSTEM FOR VISUAL INSPECTION OF SENSOR CHIPS

ORDINARY APPLICATION

Published

date

Filed on 8 February 2022

Patent Information

Application ID202241006789
Date of Application08/02/2022

Documents

NameDate
202241006789-Covering Letter [13-03-2023(online)].pdf13/03/2023
202241006789-Form 1 (Submitted on date of filing) [13-03-2023(online)].pdf13/03/2023
202241006789-Power of Attorney [13-03-2023(online)].pdf13/03/2023
202241006789-Request Letter-Correspondence [13-03-2023(online)].pdf13/03/2023
202241006789-AMENDED DOCUMENTS [09-02-2022(online)].pdf09/02/2022
202241006789-FORM 13 [09-02-2022(online)].pdf09/02/2022
202241006789-POA [09-02-2022(online)].pdf09/02/2022
202241006789-COMPLETE SPECIFICATION [08-02-2022(online)].pdf08/02/2022
202241006789-DECLARATION OF INVENTORSHIP (FORM 5) [08-02-2022(online)].pdf08/02/2022
202241006789-DRAWINGS [08-02-2022(online)].pdf08/02/2022
202241006789-FIGURE OF ABSTRACT [08-02-2022(online)].pdf08/02/2022
202241006789-FORM 1 [08-02-2022(online)].pdf08/02/2022
202241006789-POWER OF AUTHORITY [08-02-2022(online)].pdf08/02/2022
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