image
image
user-login
Patent search/

METHOD AND SYSTEM FOR FORECASTING DEFORMATION MAPS FROM SAR IMAGES USING MULTI-SCALE ATTENTION GUIDED RNN

search

Patent Search in India

  • tick

    Extensive patent search conducted by a registered patent agent

  • tick

    Patent search done by experts in under 48hrs

₹999

₹399

Talk to expert

METHOD AND SYSTEM FOR FORECASTING DEFORMATION MAPS FROM SAR IMAGES USING MULTI-SCALE ATTENTION GUIDED RNN

ORDINARY APPLICATION

Published

date

Filed on 21 September 2021

Patent Information

Application ID202121042759
Date of Application21/09/2021

Documents

NameDate
202121042759-FER.pdf21/09/2023
Abstract1.jpg02/12/2021
202121042759-FORM-26 [21-10-2021(online)].pdf21/10/2021
202121042759-COMPLETE SPECIFICATION [21-09-2021(online)].pdf21/09/2021
202121042759-DECLARATION OF INVENTORSHIP (FORM 5) [21-09-2021(online)].pdf21/09/2021
202121042759-DRAWINGS [21-09-2021(online)].pdf21/09/2021
202121042759-FIGURE OF ABSTRACT [21-09-2021(online)].jpg21/09/2021
202121042759-FORM 1 [21-09-2021(online)].pdf21/09/2021
202121042759-FORM 18 [21-09-2021(online)].pdf21/09/2021
202121042759-PROOF OF RIGHT [21-09-2021(online)].pdf21/09/2021
202121042759-REQUEST FOR EXAMINATION (FORM-18) [21-09-2021(online)].pdf21/09/2021
202121042759-STATEMENT OF UNDERTAKING (FORM 3) [21-09-2021(online)].pdf21/09/2021

footer-service

By continuing past this page, you agree to our Terms of Service,Cookie PolicyPrivacy Policy  and  Refund Policy  © - Uber9 Business Process Services Private Limited. All rights reserved.

Uber9 Business Process Services Private Limited, CIN - U74900TN2014PTC098414, GSTIN - 33AABCU7650C1ZM, Registered Office Address - F-97, Newry Shreya Apartments Anna Nagar East, Chennai, Tamil Nadu 600102, India.

Please note that we are a facilitating platform enabling access to reliable professionals. We are not a law firm and do not provide legal services ourselves. The information on this website is for the purpose of knowledge only and should not be relied upon as legal advice or opinion.