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METHOD AND SYSTEM FOR CALIBRATING AN X-RAY IMAGING SYSTEM
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Abstract
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METHOD AND SYSTEM FOR CALIBRATING AN X-RAY IMAGING SYSTEM
PCT NATIONAL PHASE APPLICATION
Published
Filed on 29 June 2020
Patent Information
| Application ID | 202017027525 |
| Date of Application | 29/06/2020 |
Documents
| Name | Date |
|---|---|
| 202017027525.pdf | 19/10/2021 |
| 202017027525-PETITION UNDER RULE 137 [12-01-2021(online)].pdf | 12/01/2021 |
| 202017027525-Proof of Right [12-01-2021(online)].pdf | 12/01/2021 |
| 202017027525-FORM 3 [30-12-2020(online)].pdf | 30/12/2020 |
| 202017027525-FORM-26 [22-08-2020(online)].pdf | 22/08/2020 |
| 202017027525-COMPLETE SPECIFICATION [29-06-2020(online)].pdf | 29/06/2020 |
| 202017027525-DECLARATION OF INVENTORSHIP (FORM 5) [29-06-2020(online)].pdf | 29/06/2020 |
| 202017027525-DRAWINGS [29-06-2020(online)].pdf | 29/06/2020 |
| 202017027525-FORM 1 [29-06-2020(online)].pdf | 29/06/2020 |
| 202017027525-PRIORITY DOCUMENTS [29-06-2020(online)].pdf | 29/06/2020 |
| 202017027525-STATEMENT OF UNDERTAKING (FORM 3) [29-06-2020(online)].pdf | 29/06/2020 |
