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METHOD AND KIT FOR MEASURING OF ANALYTES IN BI-COMPONENT SYSTEMS AND USES THEREOF

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METHOD AND KIT FOR MEASURING OF ANALYTES IN BI-COMPONENT SYSTEMS AND USES THEREOF

PCT NATIONAL PHASE APPLICATION

Published

date

Filed on 11 January 2022

Patent Information

Application ID202227001351
Date of Application11/01/2022

Documents

NameDate
202227001351-FORM 3 [27-11-2023(online)].pdf27/11/2023
202227001351-FORM 3 [17-07-2023(online)].pdf17/07/2023
202227001351-FORM 18 [08-06-2023(online)].pdf08/06/2023
202227001351-FORM 3 [13-12-2022(online)].pdf13/12/2022
202227001351-FORM 3 [07-07-2022(online)].pdf07/07/2022
202227001351-FORM-26 [17-02-2022(online)].pdf17/02/2022
202227001351-Proof of Right [11-02-2022(online)].pdf11/02/2022
202227001351-COMPLETE SPECIFICATION [11-01-2022(online)].pdf11/01/2022
202227001351-DECLARATION OF INVENTORSHIP (FORM 5) [11-01-2022(online)].pdf11/01/2022
202227001351-DRAWINGS [11-01-2022(online)].pdf11/01/2022
202227001351-FIGURE OF ABSTRACT [11-01-2022(online)].jpg11/01/2022
202227001351-FORM 1 [11-01-2022(online)].pdf11/01/2022
202227001351-NOTIFICATION OF INT. APPLN. NO. & FILING DATE (PCT-RO-105-PCT Pamphlet) [11-01-2022(online)].pdf11/01/2022
202227001351-PRIORITY DOCUMENTS [11-01-2022(online)].pdf11/01/2022
202227001351-STATEMENT OF UNDERTAKING (FORM 3) [11-01-2022(online)].pdf11/01/2022
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