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METHOD FOR PROCESSING IMAGES OF SEMICONDUCTOR STRUCTURES, AND FOR PROCESS CHARACTERIZATION AND PROCESS OPTIMIZATION BY MEANS OF SEMANTIC DATA COMPRESSION
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METHOD FOR PROCESSING IMAGES OF SEMICONDUCTOR STRUCTURES, AND FOR PROCESS CHARACTERIZATION AND PROCESS OPTIMIZATION BY MEANS OF SEMANTIC DATA COMPRESSION
PCT NATIONAL PHASE APPLICATION
Published
Filed on 1 April 2021
Patent Information
| Application ID | 202147015706 |
| Date of Application | 01/04/2021 |
Documents
| Name | Date |
|---|---|
| 202147015706-CLAIMS [04-05-2023(online)].pdf | 04/05/2023 |
| 202147015706-FER_SER_REPLY [04-05-2023(online)].pdf | 04/05/2023 |
| 202147015706-FORM 13 [04-05-2023(online)].pdf | 04/05/2023 |
| 202147015706-OTHERS [04-05-2023(online)].pdf | 04/05/2023 |
| 202147015706-FORM 3 [03-05-2023(online)].pdf | 03/05/2023 |
| 202147015706-FER.pdf | 24/11/2022 |
| 202147015706-FORM 18 [30-08-2022(online)].pdf | 30/08/2022 |
| 202147015706.pdf | 18/10/2021 |
| 202147015706-Proof of Right [16-09-2021(online)].pdf | 16/09/2021 |
| 202147015706-FORM 3 [12-08-2021(online)].pdf | 12/08/2021 |
| 202147015706-FORM-26 [20-05-2021(online)].pdf | 20/05/2021 |
| 202147015706-COMPLETE SPECIFICATION [01-04-2021(online)].pdf | 01/04/2021 |
| 202147015706-DECLARATION OF INVENTORSHIP (FORM 5) [01-04-2021(online)].pdf | 01/04/2021 |
| 202147015706-DRAWINGS [01-04-2021(online)].pdf | 01/04/2021 |
| 202147015706-FORM 1 [01-04-2021(online)].pdf | 01/04/2021 |
