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METHOD OF DEFECT ANALYSIS AT SUB-ASSEMBLY PRODUCTION LEVEL
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Abstract
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METHOD OF DEFECT ANALYSIS AT SUB-ASSEMBLY PRODUCTION LEVEL
ORDINARY APPLICATION
Published
Filed on 12 April 2021
Patent Information
| Application ID | 202111016952 |
| Date of Application | 12/04/2021 |
Documents
| Name | Date |
|---|---|
| 202111016952-FORM-9 [07-04-2022(online)].pdf | 07/04/2022 |
| 202111016952-COMPLETE SPECIFICATION [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-DECLARATION OF INVENTORSHIP (FORM 5) [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-DRAWINGS [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-EVIDENCE FOR REGISTRATION UNDER SSI [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-FIGURE OF ABSTRACT [12-04-2021(online)].jpg | 12/04/2021 |
| 202111016952-FORM 1 [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-FORM FOR SMALL ENTITY [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-FORM FOR SMALL ENTITY(FORM-28) [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-POWER OF AUTHORITY [12-04-2021(online)].pdf | 12/04/2021 |
| 202111016952-PROOF OF RIGHT [12-04-2021(online)].pdf | 12/04/2021 |
