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METHOD OF AND APPARATUS FOR REDUCING PHOTOELECTRON YIELD AND/OR SECONDARY ELECTRON YIELD
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Abstract
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METHOD OF AND APPARATUS FOR REDUCING PHOTOELECTRON YIELD AND/OR SECONDARY ELECTRON YIELD
PCT NATIONAL PHASE APPLICATION
Published
Filed on 17 January 2018
Patent Information
| Application ID | 201817001959 |
| Date of Application | 17/01/2018 |
Documents
| Name | Date |
|---|---|
| 201817001959-FORM 3 [17-07-2018(online)].pdf | 17/07/2018 |
| 201817001959-Correspondence-180418.pdf | 24/04/2018 |
| 201817001959-OTHERS-180418.pdf | 24/04/2018 |
| 201817001959-Power of Attorney-180418.pdf | 24/04/2018 |
| 201817001959-Proof of Right (MANDATORY) [18-04-2018(online)].pdf | 18/04/2018 |
| 201817001959-FORM-26 [17-04-2018(online)].pdf | 17/04/2018 |
| 201817001959.pdf | 24/03/2018 |
| abstract.jpg | 22/02/2018 |
| 201817001959-COMPLETE SPECIFICATION [17-01-2018(online)].pdf | 17/01/2018 |
| 201817001959-DECLARATION OF INVENTORSHIP (FORM 5) [17-01-2018(online)].pdf | 17/01/2018 |
| 201817001959-DRAWINGS [17-01-2018(online)].pdf | 17/01/2018 |
| 201817001959-FORM 1 [17-01-2018(online)].pdf | 17/01/2018 |
| 201817001959-STATEMENT OF UNDERTAKING (FORM 3) [17-01-2018(online)].pdf | 17/01/2018 |
