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METHOD AND APPARATUS FOR MEASURING TEMPERATURE OF SEMICONDUCTOR LAYER

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METHOD AND APPARATUS FOR MEASURING TEMPERATURE OF SEMICONDUCTOR LAYER

PCT NATIONAL PHASE APPLICATION

Published

date

Filed on 21 November 2013

Patent Information

Application ID9329/CHENP/2013
Date of Application21/11/2013

Documents

NameDate
9329-CHENP-2013-AbandonedLetter.pdf28/03/2019
9329-CHENP-2013-FER.pdf26/09/2018
9329-CHENP-2013 CORRESPONDENCE OTHERS 23-07-2015.pdf23/07/2015
9329-CHENP-2013 FORM-3 23-07-2015.pdf23/07/2015
9329-CHENP-2013 FORM-13 14-07-2015.pdf14/07/2015
Covering Letter & Form 1.pdf14/07/2015
Form 13.pdf14/07/2015
abstract-9329-CHENP-2013.jpg07/10/2014
9329-CHENP-2013 CORRESPONDENCE OTHERS 16-05-2014.pdf16/05/2014
9329-CHENP-2013 FORM 3 16-05-2014.pdf16/05/2014
9329-CHENP-2013 FORM-1 21-02-2014.pdf21/02/2014
9329-CHENP-2013 CORRESPONDENCE OTHERS 21-02-2014.pdf21/02/2014
9329-CHENP-2013.pdf10/01/2014
9329-CHENP-2013 CORRESPONDENCE OTHERS 09-01-2014.pdf09/01/2014
9329-CHENP-2013 POWER OF ATTORNEY 09-01-2014.pdf09/01/2014
Drawings.pdf25/11/2013
Form 3.pdf25/11/2013
Form 5.pdf25/11/2013
Specification.pdf25/11/2013

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