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MACHINE LEARNING BASED APPROACH TO STUDY THE STRUCTURAL, OPTICAL AND ELECTRICAL CHARACTERIZATION OF NANOSTRUCTURED POROUS SILICON
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MACHINE LEARNING BASED APPROACH TO STUDY THE STRUCTURAL, OPTICAL AND ELECTRICAL CHARACTERIZATION OF NANOSTRUCTURED POROUS SILICON
ORDINARY APPLICATION
Published
Filed on 2 December 2022
Patent Information
| Application ID | 202241069634 |
| Date of Application | 02/12/2022 |
Documents
| Name | Date |
|---|---|
| 202241069634-FORM-9 [15-12-2022(online)].pdf | 15/12/2022 |
| 202241069634-COMPLETE SPECIFICATION [02-12-2022(online)].pdf | 02/12/2022 |
| 202241069634-DRAWINGS [02-12-2022(online)].pdf | 02/12/2022 |
