image
image
user-login
Patent search/

LOW COST MICRO CRACK MEASURING INSTRUMENT FOR DETECTION OF FAULTS ON SITE IN SOLAR PANELS

Patent Search in India

  • tick

    Extensive patent search conducted by a registered patent agent

  • tick

    Patent search done by experts in under 48hrs

₹999

₹399

Talk to expert

LOW COST MICRO CRACK MEASURING INSTRUMENT FOR DETECTION OF FAULTS ON SITE IN SOLAR PANELS

ORDINARY APPLICATION

Published

date

Filed on 6 August 2021

Patent Information

Application ID202111035684
Date of Application06/08/2021

Documents

NameDate
202111035684-8(i)-Substitution-Change Of Applicant - Form 6 [23-08-2022(online)].pdf23/08/2022
202111035684-ASSIGNMENT DOCUMENTS [23-08-2022(online)].pdf23/08/2022
202111035684-FORM-26 [23-08-2022(online)]-1.pdf23/08/2022
202111035684-FORM-26 [23-08-2022(online)].pdf23/08/2022
202111035684-PA [23-08-2022(online)].pdf23/08/2022
202111035684-Proof of Right [23-08-2022(online)]-1.pdf23/08/2022
202111035684-Proof of Right [23-08-2022(online)].pdf23/08/2022
202111035684-FORM 18 [07-08-2021(online)].pdf07/08/2021
202111035684-COMPLETE SPECIFICATION [06-08-2021(online)].pdf06/08/2021
202111035684-DECLARATION OF INVENTORSHIP (FORM 5) [06-08-2021(online)].pdf06/08/2021
202111035684-DRAWINGS [06-08-2021(online)].pdf06/08/2021
202111035684-FORM 1 [06-08-2021(online)].pdf06/08/2021
202111035684-STATEMENT OF UNDERTAKING (FORM 3) [06-08-2021(online)].pdf06/08/2021
earn

Refer a friend