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INTERFERENCE MEASUREMENT PER SUBBAND PER TX BEAM FOR COMBINATION OF FDM AND MU-MIMO

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INTERFERENCE MEASUREMENT PER SUBBAND PER TX BEAM FOR COMBINATION OF FDM AND MU-MIMO

PCT NATIONAL PHASE APPLICATION

Published

date

Filed on 10 January 2022

Patent Information

Application ID202247001227
Date of Application10/01/2022

Documents

NameDate
202247001227-FORM 18 [31-07-2023(online)].pdf31/07/2023
202247001227-FORM 3 [30-06-2022(online)].pdf30/06/2022
202247001227-Proof of Right [31-01-2022(online)].pdf31/01/2022
202247001227-COMPLETE SPECIFICATION [10-01-2022(online)].pdf10/01/2022
202247001227-DECLARATION OF INVENTORSHIP (FORM 5) [10-01-2022(online)].pdf10/01/2022
202247001227-DRAWINGS [10-01-2022(online)].pdf10/01/2022
202247001227-FORM 1 [10-01-2022(online)].pdf10/01/2022
202247001227-POWER OF AUTHORITY [10-01-2022(online)].pdf10/01/2022
202247001227-PRIORITY DOCUMENTS [10-01-2022(online)].pdf10/01/2022
202247001227-STATEMENT OF UNDERTAKING (FORM 3) [10-01-2022(online)].pdf10/01/2022
202247001227-TRANSLATIOIN OF PRIOIRTY DOCUMENTS ETC. [10-01-2022(online)].pdf10/01/2022
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