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INTEGRATED CIRCUIT WITH NANOWIRE SENSORS COMPRISING A SHIELDING LAYER SENSING APPARATUS MEASURING METHOD AND MANUFACTURING METHOD

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INTEGRATED CIRCUIT WITH NANOWIRE SENSORS COMPRISING A SHIELDING LAYER SENSING APPARATUS MEASURING METHOD AND MANUFACTURING METHOD

PCT NATIONAL PHASE APPLICATION

Published

date

Filed on 12 May 2015

Patent Information

Application ID2741/CHENP/2015
Date of Application12/05/2015

Documents

NameDate
2741-CHENP-2015-IntimationOfGrant13-11-2023.pdf13/11/2023
2741-CHENP-2015-PatentCertificate13-11-2023.pdf13/11/2023
2741-CHENP-2015-FORM 13 [21-07-2023(online)].pdf21/07/2023
2741-CHENP-2015-POA [21-07-2023(online)].pdf21/07/2023
2741-CHENP-2015-RELEVANT DOCUMENTS [21-07-2023(online)].pdf21/07/2023
2741-CHENP-2015-ABSTRACT [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-CLAIMS [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-COMPLETE SPECIFICATION [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-DRAWING [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-ENDORSEMENT BY INVENTORS [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-FER_SER_REPLY [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-FORM 3 [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-FORM-26 [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-OTHERS [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-Proof of Right (MANDATORY) [13-06-2019(online)].pdf13/06/2019
2741-CHENP-2015-FER.pdf13/12/2018
Form 18 [09-09-2016(online)].pdf09/09/2016
abstract 2741-CHENP-2015.jpg22/06/2015
2012p00824wo formatted spec.pdf15/05/2015
FORM 3.pdf15/05/2015
FORM 5.pdf15/05/2015
WO2014060954-PDOC-283.pdf15/05/2015
GPOA 31-07-2013.PDF.pdf31/07/2013
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