image
image
user-login
Patent search/

IMAGING ELEMENT CONTROL METHOD AND IMAGING DEVICE

search

Patent Search in India

  • tick

    Extensive patent search conducted by a registered patent agent

  • tick

    Patent search done by experts in under 48hrs

₹999

₹399

Talk to expert

IMAGING ELEMENT CONTROL METHOD AND IMAGING DEVICE

PCT NATIONAL PHASE APPLICATION

Published

date

Filed on 26 February 2014

Patent Information

Application ID1557/CHENP/2014
Date of Application26/02/2014

Documents

NameDate
abstract 1557-CHENP-2014.jpg05/11/2014
ENGLISH TRANSLATION.pdf05/11/2014
1557-CHENP-2014 CORRESPONDENCE OTHERS 06-06-2014.pdf06/06/2014
1557-CHENP-2014 FORM-3 06-06-2014.pdf06/06/2014
1557-CHENP-2014 FORM-1 26-03-2014.pdf26/03/2014
1557-CHENP-2014 CORRESPONDENCE OTHERS 26-03-2014.pdf26/03/2014
COMPLETE SPECIFICATION.pdf03/03/2014
FORM 3.pdf03/03/2014
FORM 5.pdf03/03/2014
GPA.pdf03/03/2014
PCT IB 304.pdf03/03/2014
WIPO Cover page and English translation of the priority document.pdf03/03/2014

footer-service

By continuing past this page, you agree to our Terms of Service,Cookie PolicyPrivacy Policy  and  Refund Policy  © - Uber9 Business Process Services Private Limited. All rights reserved.

Uber9 Business Process Services Private Limited, CIN - U74900TN2014PTC098414, GSTIN - 33AABCU7650C1ZM, Registered Office Address - F-97, Newry Shreya Apartments Anna Nagar East, Chennai, Tamil Nadu 600102, India.

Please note that we are a facilitating platform enabling access to reliable professionals. We are not a law firm and do not provide legal services ourselves. The information on this website is for the purpose of knowledge only and should not be relied upon as legal advice or opinion.