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IDENTIFICATION OF FAULT IN SILICON WAFER USING IMAGE PROCESSING
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Abstract
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IDENTIFICATION OF FAULT IN SILICON WAFER USING IMAGE PROCESSING
ORDINARY APPLICATION
Published
Filed on 24 July 2023
Patent Information
| Application ID | 202311049616 |
| Date of Application | 24/07/2023 |
Documents
| Name | Date |
|---|---|
| 202311049616-COMPLETE SPECIFICATION [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-DECLARATION OF INVENTORSHIP (FORM 5) [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-EDUCATIONAL INSTITUTION(S) [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-EVIDENCE FOR REGISTRATION UNDER SSI [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-FORM 1 [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-FORM FOR SMALL ENTITY(FORM-28) [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-FORM-9 [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-POWER OF AUTHORITY [24-07-2023(online)].pdf | 24/07/2023 |
| 202311049616-REQUEST FOR EARLY PUBLICATION(FORM-9) [24-07-2023(online)].pdf | 24/07/2023 |
