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Estimating Heights Of Defects In A Wafer
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Abstract
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Estimating Heights Of Defects In A Wafer
ORDINARY APPLICATION
Published
Filed on 16 December 2020
Patent Information
| Application ID | 202041054786 |
| Date of Application | 16/12/2020 |
Documents
| Name | Date |
|---|---|
| 202041054786-FORM 3 [13-03-2021(online)].pdf | 13/03/2021 |
| 202041054786-Proof of Right [12-01-2021(online)].pdf | 12/01/2021 |
| 202041054786-Covering Letter [05-01-2021(online)].pdf | 05/01/2021 |
| 202041054786-Form 1 (Submitted on date of filing) [05-01-2021(online)].pdf | 05/01/2021 |
| 202041054786-Power of Attorney [05-01-2021(online)].pdf | 05/01/2021 |
| 202041054786-COMPLETE SPECIFICATION [16-12-2020(online)].pdf | 16/12/2020 |
| 202041054786-DECLARATION OF INVENTORSHIP (FORM 5) [16-12-2020(online)].pdf | 16/12/2020 |
| 202041054786-DRAWINGS [16-12-2020(online)].pdf | 16/12/2020 |
| 202041054786-FORM 1 [16-12-2020(online)].pdf | 16/12/2020 |
| 202041054786-FORM 18 [16-12-2020(online)].pdf | 16/12/2020 |
| 202041054786-POWER OF AUTHORITY [16-12-2020(online)].pdf | 16/12/2020 |
| 202041054786-REQUEST FOR EXAMINATION (FORM-18) [16-12-2020(online)].pdf | 16/12/2020 |
| 202041054786-STATEMENT OF UNDERTAKING (FORM 3) [16-12-2020(online)].pdf | 16/12/2020 |
| 202041054786-TRANSLATIOIN OF PRIOIRTY DOCUMENTS ETC. [16-12-2020(online)].pdf | 16/12/2020 |
