Consult an Expert
Trademark
Design Registration
Consult an Expert
Trademark
Copyright
Patent
Infringement
Design Registration
More
Consult an Expert
Consult an Expert
Trademark
Design Registration
Login
DETECTION AND COLLECTION OF X-RAY DETECTOR ARTEFACT DATA BY THE ACQUISITION SYSTEM TO SUPPORT FIELD SERVICE AND DEVELOPMENT
Extensive patent search conducted by a registered patent agent
Patent search done by experts in under 48hrs
₹999
₹399
Abstract
Information
Inventors
Applicants
Specification
Documents
PCT NATIONAL PHASE APPLICATION
Published
Filed on 11 November 2024
Abstract
The present invention relates to X-ray imaging. In order to improve artefacts management, there is provided an anomaly detection apparatus for identifying disturbance in an X-ray detector image caused by an external source. The anomaly detection apparatus comprises an input unit, a processing unit, and an output unit. The input unit is configured to receive an unexposed image acquired by an X-ray detector and metadata associated with the acquired unexposed image. The processing unit is configured to analyse the received unexposed image to determine whether there is an anomaly in the received unexposed image that is indicative of an image disturbance caused by an external source. In response to the detection of an anomaly that is indicative of an image disturbance caused by an external source, the processing unit is configured to generate a single image anomaly report comprising the received unexposed image in full or data-size-reduced form and the received metadata. The output unit is configured to provide the generated single image anomaly report.
Patent Information
Application ID | 202447086805 |
Invention Field | PHYSICS |
Date of Application | 11/11/2024 |
Publication Number | 46/2024 |
Inventors
Name | Address | Country | Nationality |
---|---|---|---|
KOEPNICK, Johannes | c/o Philips International B.V. Intellectual Property and Standards High Tech Campus 52 5656 AG Eindhoven | Netherlands | Netherlands |
VAN DER HEIJDEN, Hendrik Alexander | High Tech Campus 52 5656 AG Eindhoven | Netherlands | Netherlands |
Applicants
Name | Address | Country | Nationality |
---|---|---|---|
KONINKLIJKE PHILIPS N.V. | High Tech Campus 52 5656 AG Eindhoven | Netherlands | Netherlands |
Documents
Name | Date |
---|---|
202447086805-FORM 18 [18-11-2024(online)].pdf | 18/11/2024 |
202447086805-FORM 3 [18-11-2024(online)].pdf | 18/11/2024 |
202447086805-COMPLETE SPECIFICATION [11-11-2024(online)].pdf | 11/11/2024 |
202447086805-DECLARATION OF INVENTORSHIP (FORM 5) [11-11-2024(online)].pdf | 11/11/2024 |
202447086805-DRAWINGS [11-11-2024(online)].pdf | 11/11/2024 |
202447086805-FORM 1 [11-11-2024(online)].pdf | 11/11/2024 |
202447086805-NOTIFICATION OF INT. APPLN. NO. & FILING DATE (PCT-RO-105-PCT Pamphlet) [11-11-2024(online)].pdf | 11/11/2024 |
202447086805-PRIORITY DOCUMENTS [11-11-2024(online)].pdf | 11/11/2024 |
Talk To Experts
Calculators
Downloads
By continuing past this page, you agree to our Terms of Service,, Cookie Policy, Privacy Policy and Refund Policy © - Uber9 Business Process Services Private Limited. All rights reserved.
Uber9 Business Process Services Private Limited, CIN - U74900TN2014PTC098414, GSTIN - 33AABCU7650C1ZM, Registered Office Address - F-97, Newry Shreya Apartments Anna Nagar East, Chennai, Tamil Nadu 600102, India.
Please note that we are a facilitating platform enabling access to reliable professionals. We are not a law firm and do not provide legal services ourselves. The information on this website is for the purpose of knowledge only and should not be relied upon as legal advice or opinion.