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DEEP LEARNING MODEL FOR AUTO-FOCUSING MICROSCOPE SYSTEMS
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Abstract
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DEEP LEARNING MODEL FOR AUTO-FOCUSING MICROSCOPE SYSTEMS
PCT NATIONAL PHASE APPLICATION
Published
Filed on 5 January 2023
Patent Information
| Application ID | 202317001108 |
| Date of Application | 05/01/2023 |
Documents
| Name | Date |
|---|---|
| 202317001108-FORM 3 [14-11-2023(online)].pdf | 14/11/2023 |
| 202317001108-FORM 3 [26-06-2023(online)].pdf | 26/06/2023 |
| 202317001108-Proof of Right [02-02-2023(online)].pdf | 02/02/2023 |
| 202317001108.pdf | 07/01/2023 |
| 202317001108-COMPLETE SPECIFICATION [05-01-2023(online)].pdf | 05/01/2023 |
| 202317001108-DECLARATION OF INVENTORSHIP (FORM 5) [05-01-2023(online)].pdf | 05/01/2023 |
| 202317001108-DRAWINGS [05-01-2023(online)].pdf | 05/01/2023 |
| 202317001108-FORM 1 [05-01-2023(online)].pdf | 05/01/2023 |
| 202317001108-FORM 18 [05-01-2023(online)].pdf | 05/01/2023 |
| 202317001108-POWER OF AUTHORITY [05-01-2023(online)].pdf | 05/01/2023 |
| 202317001108-PRIORITY DOCUMENTS [05-01-2023(online)].pdf | 05/01/2023 |
| 202317001108-REQUEST FOR EXAMINATION (FORM-18) [05-01-2023(online)].pdf | 05/01/2023 |
| 202317001108-STATEMENT OF UNDERTAKING (FORM 3) [05-01-2023(online)].pdf | 05/01/2023 |
