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AN AUTOMATED PROBING SYSTEM FOR MEASURING ELECTRICAL CHARACTERISTICS OF ON-WAFER DEVICES AND A METHOD THEREOF
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Abstract
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AN AUTOMATED PROBING SYSTEM FOR MEASURING ELECTRICAL CHARACTERISTICS OF ON-WAFER DEVICES AND A METHOD THEREOF
ORDINARY APPLICATION
Published
Filed on 22 September 2020
Patent Information
| Application ID | 202031041107 |
| Date of Application | 22/09/2020 |
Documents
| Name | Date |
|---|---|
| 202031041107-FER_SER_REPLY [09-03-2022(online)].pdf | 09/03/2022 |
| 202031041107-FER.pdf | 18/10/2021 |
| 202031041107-COMPLETE SPECIFICATION [22-09-2020(online)].pdf | 22/09/2020 |
| 202031041107-DECLARATION OF INVENTORSHIP (FORM 5) [22-09-2020(online)].pdf | 22/09/2020 |
| 202031041107-DRAWINGS [22-09-2020(online)].pdf | 22/09/2020 |
| 202031041107-FORM 1 [22-09-2020(online)].pdf | 22/09/2020 |
| 202031041107-FORM 18 [22-09-2020(online)].pdf | 22/09/2020 |
| 202031041107-FORM-9 [22-09-2020(online)].pdf | 22/09/2020 |
| 202031041107-REQUEST FOR EARLY PUBLICATION(FORM-9) [22-09-2020(online)].pdf | 22/09/2020 |
| 202031041107-REQUEST FOR EXAMINATION (FORM-18) [22-09-2020(online)].pdf | 22/09/2020 |
| 202031041107-STATEMENT OF UNDERTAKING (FORM 3) [22-09-2020(online)].pdf | 22/09/2020 |
