image
image
user-login
Patent search/

AN APPARATUS AND METHOD FOR SIMULTANEOUS IN-SITU MEASUREMENT OF THERMAL FIELD AND DISPLACEMENT FIELD

Patent Search in India

  • tick

    Extensive patent search conducted by a registered patent agent

  • tick

    Patent search done by experts in under 48hrs

₹999

₹399

Talk to expert

AN APPARATUS AND METHOD FOR SIMULTANEOUS IN-SITU MEASUREMENT OF THERMAL FIELD AND DISPLACEMENT FIELD

ORDINARY APPLICATION

Published

date

Filed on 25 February 2022

Patent Information

Application ID202211010210
Date of Application25/02/2022

Documents

NameDate
202211010210-FORM-26 [22-06-2022(online)].pdf22/06/2022
202211010210-FORM-26 [04-04-2022(online)].pdf04/04/2022
202211010210-FORM-8 [07-03-2022(online)].pdf07/03/2022
202211010210-COMPLETE SPECIFICATION [25-02-2022(online)].pdf25/02/2022
202211010210-DECLARATION OF INVENTORSHIP (FORM 5) [25-02-2022(online)].pdf25/02/2022
202211010210-DRAWINGS [25-02-2022(online)].pdf25/02/2022
202211010210-FORM 1 [25-02-2022(online)].pdf25/02/2022
202211010210-FORM 18 [25-02-2022(online)].pdf25/02/2022
202211010210-PROOF OF RIGHT [25-02-2022(online)].pdf25/02/2022
202211010210-REQUEST FOR EXAMINATION (FORM-18) [25-02-2022(online)].pdf25/02/2022
earn

Refer a friend