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An AI system adapted to detect a defect in a product and method thereof.
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Abstract
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An AI system adapted to detect a defect in a product and method thereof.
ORDINARY APPLICATION
Published
Filed on 30 December 2021
Patent Information
| Application ID | 202141061726 |
| Date of Application | 30/12/2021 |
Documents
| Name | Date |
|---|---|
| 202141061726-COMPLETE SPECIFICATION [30-12-2021(online)].pdf | 30/12/2021 |
| 202141061726-DECLARATION OF INVENTORSHIP (FORM 5) [30-12-2021(online)].pdf | 30/12/2021 |
| 202141061726-DRAWINGS [30-12-2021(online)].pdf | 30/12/2021 |
| 202141061726-FORM 1 [30-12-2021(online)].pdf | 30/12/2021 |
