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AI BASED PORTABLE ELECTROMETRIC ANALYSIS KIT FOR TESTING NANO-SOLUTIONS

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AI BASED PORTABLE ELECTROMETRIC ANALYSIS KIT FOR TESTING NANO-SOLUTIONS

ORDINARY APPLICATION

Published

date

Filed on 9 January 2023

Patent Information

Application ID202341001719
Date of Application09/01/2023

Documents

NameDate
202341001719-Abstract_As Filed_09-01-2023.pdf09/01/2023
202341001719-Claims_As Filed_09-01-2023.pdf09/01/2023
202341001719-Description Complete_As Filed_09-01-2023.pdf09/01/2023
202341001719-Drawings_As Filed_09-01-2023.pdf09/01/2023
202341001719-Educational Institution Eligibility Document_FORM28_09-01-2023.pdf09/01/2023
202341001719-Form 1_As Filed_09-01-2023.pdf09/01/2023
202341001719-Form 2(Title Page)_Complete_09-01-2023.pdf09/01/2023
202341001719-Form 3_As Filed_09-01-2023.pdf09/01/2023
202341001719-Form 5_As Filed_09-01-2023.pdf09/01/2023
202341001719-Form 9_Earlier Publication_09-01-2023.pdf09/01/2023

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