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A UNIQUE SET UP FOR TEMPERATURE DEPENDENT REFLECTANCE MEASUREMENT OF SUBSTRATES/THIN FILM SAMPLES INCLUDING STABLE VO2 THIN FILM
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Abstract
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A UNIQUE SET UP FOR TEMPERATURE DEPENDENT REFLECTANCE MEASUREMENT OF SUBSTRATES/THIN FILM SAMPLES INCLUDING STABLE VO2 THIN FILM
ORDINARY APPLICATION
Published
Filed on 28 April 2023
Patent Information
| Application ID | 202331030788 |
| Date of Application | 28/04/2023 |
Documents
| Name | Date |
|---|---|
| 202331030788-FORM 18 [30-09-2023(online)].pdf | 30/09/2023 |
| 202331030788-FORM-9 [30-09-2023(online)].pdf | 30/09/2023 |
| 202331030788-FORM-26 [28-09-2023(online)].pdf | 28/09/2023 |
| 202331030788-Proof of Right [28-09-2023(online)].pdf | 28/09/2023 |
| 202331030788-COMPLETE SPECIFICATION [28-04-2023(online)].pdf | 28/04/2023 |
| 202331030788-DRAWINGS [28-04-2023(online)].pdf | 28/04/2023 |
| 202331030788-FORM 1 [28-04-2023(online)].pdf | 28/04/2023 |
