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A SYSTEM AND METHOD TO IMPROVE X RAY IMAGE ANALYSIS
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Abstract
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A SYSTEM AND METHOD TO IMPROVE X RAY IMAGE ANALYSIS
ORDINARY APPLICATION
Published
Filed on 28 December 2020
Patent Information
| Application ID | 202021056641 |
| Date of Application | 28/12/2020 |
Documents
| Name | Date |
|---|---|
| 202021056641-FER.pdf | 25/10/2023 |
| 202021056641-EDUCATIONAL INSTITUTION(S) [29-03-2023(online)].pdf | 29/03/2023 |
| 202021056641-EVIDENCE FOR REGISTRATION UNDER SSI [29-03-2023(online)].pdf | 29/03/2023 |
| 202021056641-FORM 18 [29-03-2023(online)].pdf | 29/03/2023 |
| Abstract1.jpg | 19/10/2021 |
| 202021056641-Proof of Right [06-01-2021(online)].pdf | 06/01/2021 |
| 202021056641-COMPLETE SPECIFICATION [28-12-2020(online)].pdf | 28/12/2020 |
| 202021056641-DECLARATION OF INVENTORSHIP (FORM 5) [28-12-2020(online)].pdf | 28/12/2020 |
| 202021056641-DRAWINGS [28-12-2020(online)].pdf | 28/12/2020 |
| 202021056641-FIGURE OF ABSTRACT [28-12-2020(online)].jpg | 28/12/2020 |
| 202021056641-FORM 1 [28-12-2020(online)].pdf | 28/12/2020 |
| 202021056641-POWER OF AUTHORITY [28-12-2020(online)].pdf | 28/12/2020 |
| 202021056641-STATEMENT OF UNDERTAKING (FORM 3) [28-12-2020(online)].pdf | 28/12/2020 |
