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A SYSTEM/METHOD TO DEFECT EXPOSURE IN VEGETABLES AND FRUITS USING MACHINE LEARNING ALGORITHMS
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Abstract
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ORDINARY APPLICATION
Published
Filed on 30 September 2023
Patent Information
| Application ID | 202341065922 |
| Date of Application | 30/09/2023 |
Documents
| Name | Date |
|---|---|
| 202341065922-COMPLETE SPECIFICATION [30-09-2023(online)].pdf | 30/09/2023 |
| 202341065922-DRAWINGS [30-09-2023(online)].pdf | 30/09/2023 |
| 202341065922-EDUCATIONAL INSTITUTION(S) [30-09-2023(online)].pdf | 30/09/2023 |
| 202341065922-EVIDENCE FOR REGISTRATION UNDER SSI [30-09-2023(online)].pdf | 30/09/2023 |
| 202341065922-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [30-09-2023(online)].pdf | 30/09/2023 |
| 202341065922-FORM 1 [30-09-2023(online)].pdf | 30/09/2023 |
| 202341065922-FORM FOR SMALL ENTITY(FORM-28) [30-09-2023(online)].pdf | 30/09/2023 |
| 202341065922-FORM FOR STARTUP [30-09-2023(online)].pdf | 30/09/2023 |
| 202341065922-FORM-9 [30-09-2023(online)].pdf | 30/09/2023 |
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