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A SYSTEM/METHOD TO DEFECT EXPOSURE IN VEGETABLES AND FRUITS USING MACHINE LEARNING ALGORITHMS

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A SYSTEM/METHOD TO DEFECT EXPOSURE IN VEGETABLES AND FRUITS USING MACHINE LEARNING ALGORITHMS

ORDINARY APPLICATION

Published

date

Filed on 30 September 2023

Patent Information

Application ID202341065922
Date of Application30/09/2023

Documents

NameDate
202341065922-COMPLETE SPECIFICATION [30-09-2023(online)].pdf30/09/2023
202341065922-DRAWINGS [30-09-2023(online)].pdf30/09/2023
202341065922-EDUCATIONAL INSTITUTION(S) [30-09-2023(online)].pdf30/09/2023
202341065922-EVIDENCE FOR REGISTRATION UNDER SSI [30-09-2023(online)].pdf30/09/2023
202341065922-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [30-09-2023(online)].pdf30/09/2023
202341065922-FORM 1 [30-09-2023(online)].pdf30/09/2023
202341065922-FORM FOR SMALL ENTITY(FORM-28) [30-09-2023(online)].pdf30/09/2023
202341065922-FORM FOR STARTUP [30-09-2023(online)].pdf30/09/2023
202341065922-FORM-9 [30-09-2023(online)].pdf30/09/2023
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