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A SYSTEM AND METHOD FOR PHASE IMAGING AND ABSOLUTE REFRACTIVE INDEX MEASUREMENT
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A SYSTEM AND METHOD FOR PHASE IMAGING AND ABSOLUTE REFRACTIVE INDEX MEASUREMENT
ORDINARY APPLICATION
Published
Filed on 10 May 2022
Patent Information
| Application ID | 202211026976 |
| Date of Application | 10/05/2022 |
Documents
| Name | Date |
|---|---|
| 202211026976-FORM-26 [13-07-2022(online)].pdf | 13/07/2022 |
| 202211026976-Proof of Right [13-07-2022(online)].pdf | 13/07/2022 |
| 202211026976-COMPLETE SPECIFICATION [10-05-2022(online)].pdf | 10/05/2022 |
| 202211026976-DECLARATION OF INVENTORSHIP (FORM 5) [10-05-2022(online)].pdf | 10/05/2022 |
| 202211026976-DRAWINGS [10-05-2022(online)].pdf | 10/05/2022 |
| 202211026976-FORM 1 [10-05-2022(online)].pdf | 10/05/2022 |
| 202211026976-FORM 18 [10-05-2022(online)].pdf | 10/05/2022 |
| 202211026976-REQUEST FOR EXAMINATION (FORM-18) [10-05-2022(online)].pdf | 10/05/2022 |
| 202211026976-STATEMENT OF UNDERTAKING (FORM 3) [10-05-2022(online)].pdf | 10/05/2022 |
