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A SYSTEM AND METHOD FOR MEASURING THE DIAMETER OF MULTIPLE MICRON FIBERS
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Abstract
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Inventors
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Specification
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ORDINARY APPLICATION
Published
Filed on 7 November 2024
Abstract
ABSTRACT A SYSTEM AND METHOD FOR MEASURING THE DIAMETER OF MULTIPLE MICRON FIBERS The present invention provides a method and system for real-time, non-contact measurement of the diameter (D) and position (z) of a wire using holographic imaging and diffraction analysis. A collimated laser beam is directed onto the wire, creating a diffraction pattern captured as a set of holographic images by an optical sensor. Each image is normalized to enhance intensity consistency, followed by averaging to form a processed holographic image. A set of computed holographic images, corresponding to various hypothetical positions and diameters, is generated and compared to the processed image using an error-based analysis. The image with the lowest error yields the predicted wire diameter and position, achieving micron-level accuracy. The system’s design, including a display for real-time feedback, enables high precision from distances up to 600 mm, making it ideal for industrial applications requiring detailed and efficient quality control. (FIG. 2)
Patent Information
Application ID | 202441085300 |
Invention Field | PHYSICS |
Date of Application | 07/11/2024 |
Publication Number | 46/2024 |
Inventors
Name | Address | Country | Nationality |
---|---|---|---|
Gowri Padmaja Majji | # 614, Academic C block, IIT Hyderabad, IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, India | India | India |
Krishna Venkata Janam | # 614, Academic C block, IIT Hyderabad, IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, India | India | India |
Harish Nagaraj Dixit | # 411, Academic C block, IIT Hyderabad, IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, India | India | India |
Lakshmana Dora Chandrala | # 611, Academic C block, IIT Hyderabad, IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, India | India | India |
Applicants
Name | Address | Country | Nationality |
---|---|---|---|
INDIAN INSTITUTE OF TECHNOLOGY HYDERABAD | IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, India | India | India |
Specification
Description:Please find an attachment , Claims:Please find an attachment
Documents
Name | Date |
---|---|
202441085300-FER.pdf | 09/12/2024 |
202441085300-COMPLETE SPECIFICATION [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-DECLARATION OF INVENTORSHIP (FORM 5) [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-DRAWINGS [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-EDUCATIONAL INSTITUTION(S) [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-EVIDENCE FOR REGISTRATION UNDER SSI [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-EVIDENCE OF ELIGIBILTY RULE 24C1f [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-FORM 1 [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-FORM 18A [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-FORM FOR SMALL ENTITY(FORM-28) [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-FORM-9 [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-POWER OF AUTHORITY [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-PROOF OF RIGHT [07-11-2024(online)].pdf | 07/11/2024 |
202441085300-STATEMENT OF UNDERTAKING (FORM 3) [07-11-2024(online)].pdf | 07/11/2024 |
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