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A SYSTEM AND METHOD FOR MEASURING THE DIAMETER OF MULTIPLE MICRON FIBERS

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A SYSTEM AND METHOD FOR MEASURING THE DIAMETER OF MULTIPLE MICRON FIBERS

ORDINARY APPLICATION

Published

date

Filed on 7 November 2024

Abstract

ABSTRACT A SYSTEM AND METHOD FOR MEASURING THE DIAMETER OF MULTIPLE MICRON FIBERS The present invention provides a method and system for real-time, non-contact measurement of the diameter (D) and position (z) of a wire using holographic imaging and diffraction analysis. A collimated laser beam is directed onto the wire, creating a diffraction pattern captured as a set of holographic images by an optical sensor. Each image is normalized to enhance intensity consistency, followed by averaging to form a processed holographic image. A set of computed holographic images, corresponding to various hypothetical positions and diameters, is generated and compared to the processed image using an error-based analysis. The image with the lowest error yields the predicted wire diameter and position, achieving micron-level accuracy. The system’s design, including a display for real-time feedback, enables high precision from distances up to 600 mm, making it ideal for industrial applications requiring detailed and efficient quality control. (FIG. 2)

Patent Information

Application ID202441085300
Invention FieldPHYSICS
Date of Application07/11/2024
Publication Number46/2024

Inventors

NameAddressCountryNationality
Gowri Padmaja Majji# 614, Academic C block, IIT Hyderabad, IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, IndiaIndiaIndia
Krishna Venkata Janam# 614, Academic C block, IIT Hyderabad, IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, IndiaIndiaIndia
Harish Nagaraj Dixit# 411, Academic C block, IIT Hyderabad, IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, IndiaIndiaIndia
Lakshmana Dora Chandrala# 611, Academic C block, IIT Hyderabad, IIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, IndiaIndiaIndia

Applicants

NameAddressCountryNationality
INDIAN INSTITUTE OF TECHNOLOGY HYDERABADIIT Hyderabad Road, Near NH-65, Sangareddy, Kandi, Telangana 502284, IndiaIndiaIndia

Specification

Description:Please find an attachment , Claims:Please find an attachment

Documents

NameDate
202441085300-FER.pdf09/12/2024
202441085300-COMPLETE SPECIFICATION [07-11-2024(online)].pdf07/11/2024
202441085300-DECLARATION OF INVENTORSHIP (FORM 5) [07-11-2024(online)].pdf07/11/2024
202441085300-DRAWINGS [07-11-2024(online)].pdf07/11/2024
202441085300-EDUCATIONAL INSTITUTION(S) [07-11-2024(online)].pdf07/11/2024
202441085300-EVIDENCE FOR REGISTRATION UNDER SSI [07-11-2024(online)].pdf07/11/2024
202441085300-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [07-11-2024(online)].pdf07/11/2024
202441085300-EVIDENCE OF ELIGIBILTY RULE 24C1f [07-11-2024(online)].pdf07/11/2024
202441085300-FORM 1 [07-11-2024(online)].pdf07/11/2024
202441085300-FORM 18A [07-11-2024(online)].pdf07/11/2024
202441085300-FORM FOR SMALL ENTITY(FORM-28) [07-11-2024(online)].pdf07/11/2024
202441085300-FORM-9 [07-11-2024(online)].pdf07/11/2024
202441085300-POWER OF AUTHORITY [07-11-2024(online)].pdf07/11/2024
202441085300-PROOF OF RIGHT [07-11-2024(online)].pdf07/11/2024
202441085300-STATEMENT OF UNDERTAKING (FORM 3) [07-11-2024(online)].pdf07/11/2024

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