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A SYSTEM AND METHOD FOR MEASUREMENT OF TOTAL HEMISPHERICAL EMISSIVITY OF AN OPAQUE MATERIAL
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Abstract
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A SYSTEM AND METHOD FOR MEASUREMENT OF TOTAL HEMISPHERICAL EMISSIVITY OF AN OPAQUE MATERIAL
ORDINARY APPLICATION
Published
Filed on 26 September 2022
Patent Information
| Application ID | 202221054936 |
| Date of Application | 26/09/2022 |
Documents
| Name | Date |
|---|---|
| 202221054936-CLAIMS [14-04-2023(online)].pdf | 14/04/2023 |
| 202221054936-DRAWING [14-04-2023(online)].pdf | 14/04/2023 |
| 202221054936-FER_SER_REPLY [14-04-2023(online)].pdf | 14/04/2023 |
| 202221054936-FER.pdf | 25/01/2023 |
| Abstract.jpg | 18/11/2022 |
| 202221054936-FORM 18 [16-11-2022(online)].pdf | 16/11/2022 |
| 202221054936-FORM-9 [16-11-2022(online)].pdf | 16/11/2022 |
| 202221054936-COMPLETE SPECIFICATION [26-09-2022(online)].pdf | 26/09/2022 |
| 202221054936-DECLARATION OF INVENTORSHIP (FORM 5) [26-09-2022(online)].pdf | 26/09/2022 |
| 202221054936-DRAWINGS [26-09-2022(online)].pdf | 26/09/2022 |
| 202221054936-FIGURE OF ABSTRACT [26-09-2022(online)].pdf | 26/09/2022 |
| 202221054936-FORM 1 [26-09-2022(online)].pdf | 26/09/2022 |
| 202221054936-POWER OF AUTHORITY [26-09-2022(online)].pdf | 26/09/2022 |
| 202221054936-STATEMENT OF UNDERTAKING (FORM 3) [26-09-2022(online)].pdf | 26/09/2022 |
