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A SYSTEM FOR DETECTING CRACKS IN SEMICONDUCTOR SUBSTRATES AND METHOD THEREOF
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Abstract
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A SYSTEM FOR DETECTING CRACKS IN SEMICONDUCTOR SUBSTRATES AND METHOD THEREOF
ORDINARY APPLICATION
Published
Filed on 7 March 2022
Patent Information
| Application ID | 202231012053 |
| Date of Application | 07/03/2022 |
Documents
| Name | Date |
|---|---|
| 202231012053-COMPLETE SPECIFICATION [07-03-2022(online)].pdf | 07/03/2022 |
| 202231012053-DECLARATION OF INVENTORSHIP (FORM 5) [07-03-2022(online)].pdf | 07/03/2022 |
| 202231012053-DRAWINGS [07-03-2022(online)].pdf | 07/03/2022 |
| 202231012053-FIGURE OF ABSTRACT [07-03-2022(online)].jpg | 07/03/2022 |
| 202231012053-FORM 1 [07-03-2022(online)].pdf | 07/03/2022 |
| 202231012053-FORM 18 [07-03-2022(online)].pdf | 07/03/2022 |
| 202231012053-POWER OF AUTHORITY [07-03-2022(online)].pdf | 07/03/2022 |
| 202231012053-PROOF OF RIGHT [07-03-2022(online)].pdf | 07/03/2022 |
