A SYSTEM FOR COLLECTING A REFLECTIVE LIGHT BEAM SPECTRUM

Abstract

The present subject matter discloses a system for collecting a for collecting a reflective light beam spectrum. The system includes a plurality of optical components in an optical path configured to direct an incident light beam towards a first direction. The system includes a substrate while being heated, placed horizontally below the plurality of optical components. The substrate is configured to receive the incident light beam, and reflect the reflective light beam spectrum via the optical path of the plurality of optical components upon receiving the incident light beam. The system includes a beam splitter configured to receive the reflective light beam spectrum from the substrate via the optical path, and direct the reflective light beam spectrum towards a second direction. The system further includes an optical fiber holder placed in the second direction. The optical fiber holder is configured to collect the reflective light beam spectrum. (FIG. 1)

Specification

Description:TECHNICAL FIELD
[001] The present subject matter relates a system for collecting a reflective light beam spectrum. Particularly, the present subject matter relates to a spectrometer analysis to monitor optical properties of a substrate in real time.
BACKGROUND OF THE INVENTION

[002] The background description includes information that may be useful in understanding the present invention.
[003] The application of heat to change the shape of metals and alloys is a well-established method to modify certain properties of the material. The easiest and most feasible method to study the changes is to look at the color change on the material and link it to the structural change. For example, gold nanoparticles show different color shades based on size and shape. The different colour spectrums are because of different surface plasmon resonances when the nanoparticles interact with visible light. The change in colour of such nanoparticles can be related to the change in shape. For instance, the spherical gold nanoparticles exhibit red color shades, gold nanocubes show magenta color shades, gold bipyramid nanoparticles show violet color shades, and gold nanorods can show a huge variety of shades from reddish to dark bluish based on the size. The shape changes of anisotropic nanoparticles like nanorods and bipyramids can be easily understood by looking at the change in color. These anisotropic nanoparticles coated on the substrate give us an understanding of the real-time shape and size change of the particles when heated to specific temperatures. This shape change is related to the change in resonance frequency. This frequency shift needs to be monitored to get a clear understanding of the shape change to that of the heating rate. Additionally, currently present electron microscopy often brings us a challenge with different sample preparation methods, real-time monitoring, product volume, and cost-effectiveness. The cost of an electron microscope is high and also requires a huge space to accommodate.
[004] However, there are no such setup or device available that can measure the real-time spectrum shift of a substrate on the application of heating.
[005] Therefore, a pressing need exists for the development of an optical system or device capable of measuring the real-time spectral shift of a substrate undergoing surface structure modifications due to external stimuli, such as heat. A system which enables the investigation of analogous structural change in various substrates, including multi-component thin films and different spinodal shape transformations, as well as their corresponding effects on spectral properties. Such a system would provide insights into the heating rates and temperatures required to tune the frequency to the desired wavelength, thereby contributing significantly to scientific understanding.

OBJECTS OF THE INVENTION
[006] Some of the objects of the present disclosure, which at least one embodiment herein satisfy, are listed herein below.
[007] The object of the present invention is to develop an optical system capable of monitoring the optical properties of a substrate in real time while applying external heat.
[008] Another object of the present invention is to develop a system capable of real-time monitoring of structural modifications, including changes in the shape, size, composition, and distribution of materials or substrates on a surface for enhanced scientific understanding.
[009] Yet another objective of the invention is to develop a system capable of precisely controlling external stimuli, such as heat, to achieve desired outcomes.
[010] Yet another object of the present invention is to develop a portable and a cost-effective system or a device.
[011] These and other objects and advantages will become more apparent when reference is made to the following description and accompanying drawings.

SUMMARY OF THE INVENTION
[012] This summary is provided to introduce the concepts related to an integrated apparatus for simultaneous in-situ identification of one or more reactive intermediates on a surface of an electrode or of an electrolyte under any fixed or variable atmospheric condition.
[013] The present subject matter discloses a system for collecting a reflective light beam spectrum. The system includes a plurality of optical components arranged in an optical path configured to direct an incident light beam towards a first direction. The system includes a substrate while being heated, placed horizontally below the plurality of optical components in the first direction. The substrate is configured to receive the incident light beam, and reflect the reflective light beam spectrum via the optical path of the plurality of optical components upon receiving the incident light beam. The system includes a beam splitter amongst the plurality of optical components. The beam splitter is configured to receive the reflective light beam spectrum from the substrate via the optical path, and direct the reflective light beam spectrum towards a second direction. The system further includes a reflected light optical fiber holder placed in the second direction. The reflected light optical fiber holder is configured to collect the reflective light beam spectrum, and transmit the reflective light beam spectrum to a spectrometer. The reflective light beam spectrum is analysed by the spectrometer.
[014] Various objects, features, aspects, and advantages of the inventive subject matter will become more apparent from the following detailed description of preferred embodiments, along with the accompanying drawing figures in which like numerals represent like components.

BRIEF DESCRIPTION OF THE ACCOMPANYING DRAWINGS
[015] The illustrated embodiments of the subject matter will be understood by reference to the drawings, wherein like parts are designated by like numerals throughout. The following description is intended only by way of example and simply illustrates certain selected embodiments of devices, systems, and methods that are consistent with the subject matter as claimed herein, wherein:
[016] Figure 1 illustrates a schematic block diagram of a system for collecting a reflective light beam spectrum, in accordance with an embodiment of the present subject matter;
[017] Figure 2 illustrates an architectural diagram depicting a collection of a reflective light beam spectrum, in accordance with an embodiment of the present subject matter;
[018] Figures 3a and 3b illustrate a side view image and a top view image of the system for collecting a reflective light beam spectrum, in accordance with an embodiment of the present subject matter;
[019] Figure 4a illustrates a graphical representation depicting a complete heating cycle of 30 minutes to which a substrate is subjected, in accordance with an embodiment of the present subject matter; and
[020] Figure 4b illustrates a graphical representation depicting a real time shift of the spectrum from around 800 nm to 560 nm, in accordance with an embodiment of the present subject matter;
[021] Figure 5a illustrates an image depicting an as prepared substrate including a transverse peak around 550 nm and a longitudinal peak around 800 nm, in accordance with an embodiment of the present subject matter; and
[022] Figure 5b illustrates an image depicting the as prepared substrate with a reddish shade as the longitudinal peak of the AuNBPs is around a wide 560 nm peak, in accordance with an embodiment of the present subject matter;
[023] Figure 6a illustrates an image depicting a substrate covered with AuNBPs particles, in accordance with an embodiment of the present subject matter; and
[024] Figure 6b illustrates an image depicting the substrate upon heating having spherical and a number of elongated random shaped nanoparticles.
[025] The figures depict embodiments of the present subject matter for the purposes of illustration only. A person skilled in the art will easily recognize from the following description that alternative embodiments of the structures and methods illustrated herein may be employed without departing from the principles of the disclosure described herein.

DETAILED DESCRIPTION
[026] The following is a detailed description of embodiments of the disclosure depicted in the accompanying drawings. The embodiments are in such detail as to clearly communicate the disclosure. However, the amount of detail offered is not intended to limit the anticipated variations of embodiments; on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the present disclosure as defined by the appended claims.
[027] While the embodiments of the disclosure are subject to various modifications and alternative forms, specific embodiments thereof have been shown by way of example in the figures and will be described below. It should be understood, however, that it is not intended to limit the disclosure to the particular forms disclosed, but on the contrary, the disclosure is to cover all modifications, equivalents, and alternatives falling within the scope of the disclosure.
[028] The terms "comprises", "comprising", or any other variations thereof used in the disclosure, are intended to cover a non-exclusive inclusion, such that a device, system, or assembly that comprises a list of components does not include only those components but may include other components not expressly listed or inherent to such system, or assembly, or device. In other words, one or more elements in a system or device proceeded by "comprises… a" does not, without more constraints, preclude the existence of other elements or additional elements in the system or device.
[029] Figure 1 illustrates a schematic block diagram 100 of a system 102 for collecting a reflective light beam spectrum, in accordance with an embodiment of the present subject matter. The system 102 may be an optical set up coupled with a heating stage. The system 102 may be configured to perform a spectrometer analysis to monitor optical properties of a substrate in real time. The monitoring may be performed to determine one or more spectrum shifts occurring due to one or more surface structure modifications on the substrate while applying an external stimuli. The external stimuli may be heat. The system 102 may also be used to measure a whole spectral band from Ultra Violet to near Infrared Region. The system 102 may be configured to collect the reflective light beam spectrum in a reflection mode while heating the substrate.
[030] Continuing with the above embodiment, the system 102 may include a number of optical components 104, a substrate 106, a beam splitter 108, and a reflected light optical fiber holder 110. The number of optical components 104 may be arranged in an optical path configured to direct an incident light beam towards a first direction. The incident light beam may be a white light received from a tungsten filament lamp. The substrate 106 may be heated and while being heated, may be placed horizontally below the number of optical components 104 in the first direction.
[031] The number of optical components 104 may include an incident light optical fiber holder 104a configured to allow the incident light beam from a tungsten filament lamp to pass through via the optical path. The number of optical components 104 may further include a first convex lens 104b configured to converge the incident light beam to the beam splitter 108. The beam splitter 108 amongst the number of components 104, may allow the incident light beam to pass through via the optical path, while splitting the incident light beam into a plurality of directions. The number of directions may include a first direction towards X axis and a second direction towards Y axis. The second direction is 90 degrees with respect to the incident light beam. The number of optical components 104 may also include a mirror 104c aligned at a first angle with respect to the number of optical components 104, configured to reflect the incident light beam in the first direction towards the substrate 106 via a second convex lens 104d. The second convex lens 104d may be configured to converge the incident light beam to a pinpoint focus on the substrate 106. The substrate 106 may be configured to receive the incident light beam. Upon receiving the incident light beam, the substrate 106 may be configured to reflect the reflective light beam spectrum via the optical path of the number of optical components 104 upon receiving the incident light beam.
[032] Moving forward, the beam splitter 108 may be configured to receive the reflective light beam spectrum from the substrate 106 via the optical path. Furthermore, the beam splitter 108 may be configured to direct the reflective light beam spectrum towards a second direction. The beam splitter 108 may divide the incident light beam into its x-y components. One portion of the incident light beam may be transmitted towards the substrate 106 while another portion may be reflected towards the reflected light optical fiber holder 110. To that understanding, the reflected light optical fiber holder 110 may be placed in the second direction. The reflected light optical fiber holder 110 may be configured to collect the reflective light beam spectrum. The reflected light optical fiber holder 110 may be configured to transmit the reflective light beam spectrum to a spectrometer. The reflective light beam spectrum may be analysed by the spectrometer. The spectrometer may analyse the reflective light beam spectrum reflected from the substrate at a number of temperatures to determine the one or more real-time spectrum shifts occurring due to one or more surface structure modifications on the substrate while being heated. The substrate may be heated in one or more of an ambient environment and isolated environment to monitor effects in real time. The spectrometer may analyze spectral characteristics of the collected light, enabling a detection of real-time changes in the substrate's properties, such as those induced by alterations in shape, size, and composition. By monitoring these spectral shifts in real-time, the system 102 provides critical insights into the dynamic behavior of substrate under various conditions.
[033] The substrate 106 may be heated by being placed on a heating unit. The heating unit may precisely control the temperature of the substrate 106. A controlled heating environment enables a study of temperature-dependent effects on optical characteristics of the substrate 106. The system 102 may also include an aperture 104e between the beam splitter 108 and the mirror 104c, aligned at a specific angle, configured to adjust an amount of the incident light beam and the reflective light beam spectrum travelling through the optical path. The aperture 104e may regulate an intensity of both the incident light beam and the reflected light beam spectrum. By controlling the intensity or amount of light coming to the sample we are able to play with the signal quality. This helps in getting good signal without saturating the detector of the spectrometer.
[034] Figure 2 illustrates an architectural diagram 200 depicting a collection of a reflective light beam spectrum, in accordance with an embodiment of the present subject matter. The collection may be performed by the system 102 as referred in the figure 1. The number of optical components 104 may be positioned on an optical path allowing an incident light beam spectrum to pass through in first direction and a reflective light beam spectrum in second direction via the beam splitter 108 respectively.
[035] The architectural diagram 200 may be an optical setup coupled with a heating stage. The system 102 may collect the reflective light beam spectrum in a reflection mode while heating the substrate. The reflected light beam spectrum may travel back a same optical path to a collecting optical fiber. The collecting optical fiber collects the reflected light from the beam splitter, and the reflective light beam spectrum is sent to a spectrophotometer. The spectrophotometer then records the spectrum.
[036] The system 102 may collect the reflection light beam spectrum from any substrate when it is heated at different temperatures allowing to study a real-time spectrum shift on substrate heating. The system 102 may help study an optical response that emerges due to a surface structure modification. The study may provide a measure of a change in spectrum with the change in size or shape.
[037] Continuing with the above embodiment, the number of optical components 104 may be arranged in an optical path configured to direct the incident light beam towards a first direction. The substrate 106 may be placed horizontally below the number of optical components 104 in the first direction. The incident light optical fiber holder 104a may be configured to allow the incident light beam from a tungsten filament lamp to pass through via the optical path. The first convex lens 104b may be configured to converge the incident light beam to the beam splitter 108. The beam splitter 108 may allow the incident light beam to pass through via the optical path, while splitting the incident light beam into X and Y components. The mirror 104c aligned at a first angle with respect to the number of optical components 104, may be configured to reflect the incident light beam in the first direction towards the substrate 106 via the second convex lens 104d that converge the incident light beam to a pinpoint focus on the substrate 106.
[038] Moving forward, the substrate 106 may be configured to receive the incident light beam and reflect the reflective light beam spectrum via the optical path of the number of optical components 104 upon receiving the incident light beam. The beam splitter 108 may be configured to direct the reflective light beam spectrum towards a second direction. The beam splitter 108 may divide the incident light beam into its x-y components. One portion of the incident light beam may be transmitted towards the substrate 106 while another portion may be reflected towards the reflected light optical fiber holder 110. To that understanding, the reflected light optical fiber holder 110 may be placed in the second direction. The reflected light optical fiber holder 110 may be configured to collect and transmit the reflective light beam spectrum to a spectrometer for analysis. The spectrometer may analyse the reflective light beam spectrum at a number of temperatures to determine the one or more real-time spectrum shifts occurring due to one or more surface structure modifications on the substrate while being heated.
[039] Figures 3a and 3b illustrate a side view image 300a and a top view image 300b of the system 102 for collecting the reflective light beam spectrum, in accordance with an embodiment of the present subject matter. The number of optical components positioned in an optical path in as shown in figure (2), may be responsible for collecting one or more spectrum reflected from a substrate 106 placed on a heating unit while being heated at different temperature levels.
[040] Figure 4a illustrates a graphical representation 400a depicting a complete heating cycle of 30 minutes to which a substrate is subjected, in accordance with an embodiment of the present subject matter. An initial part of temperature with respect to graphical representation 400a indicates a heating ramp up duration and a straight line shows the holding duration of the substrate at 300°C.
[041] Figure 4b illustrates a graphical representation depicting a real time shift of the spectrum from around 800 nm to 560 nm, in accordance with an embodiment of the present subject matter.
[042] Figure 5a illustrates an image depicting an as prepared substrate including a transverse peak around 550 nm and a longitudinal peak around 800 nm, in accordance with an embodiment of the present subject matter.
[043] Figure 5b illustrates an image depicting the as prepared substrate with a reddish shade as the longitudinal peak of the AuNBPs is around a wide 560 nm peak, in accordance with an embodiment of the present subject matter. This may signify a change in shape and size.
[044] Figure 6a illustrates an image 600a depicting a substrate covered with AuNBPs particles, in accordance with an embodiment of the present subject matter.
[045] Figure 6b illustrates an image 600b depicting the substrate upon heating having spherical and a number of elongated nanoparticles, in accordance with an embodiment of the present subject matter. So, it may be determined that a shape change of nanoparticles may directly be related to a change in spectrum of a substrate. Therefore, change in the spectrum may need to be monitored in real-time to control the change in shape.
[046] The advantages of the present subject matter are provided below:
a. Insitu monitoring gives us an idea of spectrum shift to change in shape and size.
b. Better understanding of thermodynamics on metallic nanoparticles shape, size and thin films.
c. A portable and a cost-effective solution for monitoring the spectrum shift.

Component no. Name of the component
104a Incident light optical fiber holder
104b First Convex lens
108 Beam Splitter
104c Mirror
104d Second Convex Lens
104e Aperture
106 Substrate
110 Reflected light optical fiber holder


[047] It should be noted that the description and figures merely illustrate the principles of the present subject matter. It should be appreciated by those skilled in the art that conception and specific embodiment disclosed may be readily utilized as a basis for modifying or designing other structures for carrying out the same purposes of the present subject matter. It should also be appreciated by those skilled in the art by devising various systems that, although not explicitly described or shown herein, embody the principles of the present subject matter and are included within its spirit and scope. Furthermore, all examples recited herein are principally intended expressly to be for pedagogical purposes to aid the reader in understanding the principles of the present subject matter and the concepts contributed by the inventor(s) to further the art and are to be construed as being without limitation to such specifically recited examples and conditions. The novel features which are believed to be characteristic of the present subject matter, both as to its organization and method of operation, together with further objects and advantages will be better understood from the following description when considered in connection with the accompanying figures.
[048] Although embodiments for the present subject matter have been described in language specific to package features, it is to be understood that the present subject matter is not necessarily limited to the specific features described. Rather, the specific features and methods are disclosed as embodiments for the present subject matter. Numerous modifications and adaptations of the system/device of the present invention will be apparent to those skilled in the art, and thus it is intended by the appended claims to cover all such modifications and adaptations which fall within the scope of the present subject matter.
 
, Claims:We Claim:
1. A system (102) for collecting a reflective light beam spectrum comprising:

a plurality of optical components (104) arranged in an optical path configured to direct an incident light beam towards a first direction;
a substrate (106) while being heated, placed horizontally below the plurality of optical components in the first direction, configured to:
receive the incident light beam;
reflect the reflective light beam spectrum via the optical path of the plurality of optical components upon receiving the incident light beam;

a beam splitter (108) amongst the plurality of optical components configured to:
receive the reflective light beam spectrum from the substrate (106) via the optical path; and
direct the reflective light beam spectrum towards a second direction; and
an optical fiber holder (110) placed in the second direction, configured to:
collect the reflective light beam spectrum; and
transmit the reflective light beam spectrum to a spectrometer, wherein the reflective light beam spectrum is analysed by the spectrometer.

2. The system (102) as claimed in claim 1, wherein the substrate (106) is heated by being placed on a heating unit.
3. The system (102) as claimed in claim 1, wherein the spectrometer analyses the reflective light beam spectrum reflected from the substrate (106) at a plurality of temperatures to determine one or more real-time spectrum shifts occurring due to one or more surface structure modifications on the substrate (106) while being heated.
4. The system (102) as claimed in claim 1, wherein the incident light beam is a white light received from a tungsten filament lamp.
5. The system (102) as claimed in claim 1, wherein the plurality of optical components (104) comprises:
an incident light optical fiber holder (104a) configured to allow the incident light beam from a tungsten filament lamp to pass through via the optical path:
a first convex lens (104b) configured to converge the incident light beam to the beam splitter (108), wherein the beam splitter (108) allows the incident light beam to pass through via the optical path while splitting the incident light beam into a plurality of directions; and
a mirror (104c) aligned at a first angle with respect to the plurality of optical components, configured to reflect the incident light beam in the first direction towards the substrate (106) via a second convex lens (104d), wherein the second convex lens is configured to converge the incident light beam to a pinpoint focus on the substrate (106).
6. The system (102) as claimed in claim 1, further comprises an aperture (104e) between the beam splitter (108) and the mirror configured to adjust an amount of the incident light beam and the reflective light beam spectrum travelling through the optical path.

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