Consult an Expert
Trademark
Design Registration
Consult an Expert
Trademark
Copyright
Patent
Infringement
Design Registration
More
Consult an Expert
Consult an Expert
Trademark
Design Registration
Login
Patent search/
A Novel Layered Approach for the Measurement of Design Properties to Infer on the Improvement of Quality using Aspect Oriented Software Development
Patent Search in India
Extensive patent search conducted by a registered patent agent
Patent search done by experts in under 48hrs
₹999
₹399
Talk to expert
Abstract
Information
Inventors
Applicants
Specification
Documents
A Novel Layered Approach for the Measurement of Design Properties to Infer on the Improvement of Quality using Aspect Oriented Software Development
ORDINARY APPLICATION
Published
Filed on 30 June 2022
Information
| Application ID | 202241037524 |
| Date of Application | 30/06/2022 |
Documents
| Name | Date |
|---|---|
| 202241037524-COMPLETE SPECIFICATION [30-06-2022(online)].pdf | 30/06/2022 |
| 202241037524-DECLARATION OF INVENTORSHIP (FORM 5) [30-06-2022(online)].pdf | 30/06/2022 |
| 202241037524-DRAWINGS [30-06-2022(online)].pdf | 30/06/2022 |
| 202241037524-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [30-06-2022(online)].pdf | 30/06/2022 |
| 202241037524-FORM 1 [30-06-2022(online)].pdf | 30/06/2022 |
| 202241037524-FORM FOR SMALL ENTITY(FORM-28) [30-06-2022(online)].pdf | 30/06/2022 |
| 202241037524-REQUEST FOR EARLY PUBLICATION(FORM-9) [30-06-2022(online)].pdf | 30/06/2022 |
