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A Novel Layered Approach for the Measurement of Design Properties to Infer on the Improvement of Quality using Aspect Oriented Software Development

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A Novel Layered Approach for the Measurement of Design Properties to Infer on the Improvement of Quality using Aspect Oriented Software Development

ORDINARY APPLICATION

Published

date

Filed on 30 June 2022

Patent Information

Application ID202241037524
Date of Application30/06/2022

Documents

NameDate
202241037524-COMPLETE SPECIFICATION [30-06-2022(online)].pdf30/06/2022
202241037524-DECLARATION OF INVENTORSHIP (FORM 5) [30-06-2022(online)].pdf30/06/2022
202241037524-DRAWINGS [30-06-2022(online)].pdf30/06/2022
202241037524-EVIDENCE FOR REGISTRATION UNDER SSI(FORM-28) [30-06-2022(online)].pdf30/06/2022
202241037524-FORM 1 [30-06-2022(online)].pdf30/06/2022
202241037524-FORM FOR SMALL ENTITY(FORM-28) [30-06-2022(online)].pdf30/06/2022
202241037524-REQUEST FOR EARLY PUBLICATION(FORM-9) [30-06-2022(online)].pdf30/06/2022

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