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A MONITORING SYSTEM BASED ON ETCHING OF METALS

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A MONITORING SYSTEM BASED ON ETCHING OF METALS

DIVISIONAL PCT NATIONAL PHASE APPLICATION

Published

date

Filed on 8 April 2023

Patent Information

Application ID202328026321
Date of Application08/04/2023

Documents

NameDate
202328026321-FORM-26 [16-06-2023(online)].pdf16/06/2023
202328026321.pdf09/05/2023
Abstract1.jpg09/05/2023
202328026321-COMPLETE SPECIFICATION [08-04-2023(online)].pdf08/04/2023
202328026321-DECLARATION OF INVENTORSHIP (FORM 5) [08-04-2023(online)].pdf08/04/2023
202328026321-DRAWINGS [08-04-2023(online)].pdf08/04/2023
202328026321-FIGURE OF ABSTRACT [08-04-2023(online)].pdf08/04/2023
202328026321-FORM 1 [08-04-2023(online)].pdf08/04/2023
202328026321-FORM 18 [08-04-2023(online)].pdf08/04/2023
202328026321-PRIORITY DOCUMENTS [08-04-2023(online)].pdf08/04/2023
202328026321-PROOF OF RIGHT [08-04-2023(online)].pdf08/04/2023
202328026321-REQUEST FOR EXAMINATION (FORM-18) [08-04-2023(online)].pdf08/04/2023
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