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A METHOD FOR PREVENTING PLASMA DAMAGES TO SURFACES OF SILICON WAFER DURING PLASMA DEPOSITION PROCESS IN A PLASMA CHAMBER

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A METHOD FOR PREVENTING PLASMA DAMAGES TO SURFACES OF SILICON WAFER DURING PLASMA DEPOSITION PROCESS IN A PLASMA CHAMBER

ORDINARY APPLICATION

Published

date

Filed on 29 April 2015

Patent Information

Application ID473/KOL/2015
Date of Application29/04/2015

Documents

NameDate
473-KOL-2015-Correspondence to notify the Controller [17-11-2023(online)].pdf17/11/2023
473-KOL-2015-US(14)-HearingNotice-(HearingDate-20-11-2023).pdf18/10/2023
473-KOL-2015-DRAWING [21-01-2019(online)].pdf21/01/2019
473-KOL-2015-FER_SER_REPLY [21-01-2019(online)].pdf21/01/2019
473-KOL-2015-OTHERS [21-01-2019(online)].pdf21/01/2019
473-KOL-2015-FER.pdf31/07/2018
473-KOL-2015-Correspondence-180515.pdf01/09/2015
473-KOL-2015-Form 1-180515.pdf01/09/2015
DW.pdf10/07/2015
F2.pdf10/07/2015
F3.pdf10/07/2015
FOA.pdf10/07/2015
GPA.pdf10/07/2015
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