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A METHOD AND A SYSTEM FOR MEASURING REAL WORLD DISTANCE IN X-RAY IMAGES
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A METHOD AND A SYSTEM FOR MEASURING REAL WORLD DISTANCE IN X-RAY IMAGES
ORDINARY APPLICATION
Published
Filed on 20 March 2015
Patent Information
| Application ID | 300/KOL/2015 |
| Date of Application | 20/03/2015 |
Documents
| Name | Date |
|---|---|
| 300-KOL-2015-(22-04-2015)-CORRESPONDENCE.pdf | 22/04/2015 |
| 300-KOL-2015-(22-04-2015)-FORM-1.pdf | 22/04/2015 |
| DRWNGS.pdf | 28/03/2015 |
| F2.pdf | 28/03/2015 |
| F3.pdf | 28/03/2015 |
| FOA.pdf | 28/03/2015 |
