Consult an Expert
Trademark
Design Registration
Consult an Expert
Trademark
Copyright
Patent
Infringement
Design Registration
More
Consult an Expert
Consult an Expert
Trademark
Design Registration
Login
Patent search/
A Critical Assessment of Automated Machine Learning Based On Experimental Statistics
Patent Search in India
Extensive patent search conducted by a registered patent agent
Patent search done by experts in under 48hrs
₹999
₹399
Talk to expert
Abstract
Information
Inventors
Applicants
Specification
Documents
A Critical Assessment of Automated Machine Learning Based On Experimental Statistics
ORDINARY APPLICATION
Published
Filed on 8 October 2022
Patent Information
| Application ID | 202241057678 |
| Date of Application | 08/10/2022 |
Documents
| Name | Date |
|---|---|
| 202241057678-COMPLETE SPECIFICATION [08-10-2022(online)].pdf | 08/10/2022 |
| 202241057678-DECLARATION OF INVENTORSHIP (FORM 5) [08-10-2022(online)].pdf | 08/10/2022 |
| 202241057678-DRAWINGS [08-10-2022(online)].pdf | 08/10/2022 |
| 202241057678-FORM 1 [08-10-2022(online)].pdf | 08/10/2022 |
| 202241057678-FORM-9 [08-10-2022(online)].pdf | 08/10/2022 |
| 202241057678-POWER OF AUTHORITY [08-10-2022(online)].pdf | 08/10/2022 |
| 202241057678-REQUEST FOR EARLY PUBLICATION(FORM-9) [08-10-2022(online)].pdf | 08/10/2022 |
